Auger Resonant Raman Scattering in Itinerant Electron Systems: Continuum Excitation in Cu

A. Föhlisch; O. Karis; M. Weinelt; J. Hasselström; A. Nilsson; N. Mårtensson

doi:10.1103/PhysRevLett.88.027601

Auger Resonant Raman Scattering in Itinerant Electron Systems: Continuum Excitation in Cu

A. Föhlisch, O. Karis, M. Weinelt, J. Hasselström, A. Nilsson, and N. Mårtensson

Phys. Rev. Lett. 88, 027601 – Published 28 December 2001

Abstract

The role of electron localization for resonant photoemission and Auger resonant Raman scattering to occur in an extended system was studied by polarization dependent resonant photoemission at the Cu $L$ edges. Auger resonant Raman scattering was observed for continuum excitation into van Hove singularities at the $L_{(1)}$ and $X_{(1)}$ points, 4.2 and 7.7 eV above threshold. These findings show that resonant photoemission and Auger resonant Raman scattering are general features of photoemission independent of the degree of electron localization.

Received 2 November 2000

DOI:https://doi.org/10.1103/PhysRevLett.88.027601

Authors & Affiliations

A. Föhlisch^*,†, O. Karis, M. Weinelt^‡, J. Hasselström, A. Nilsson, and N. Mårtensson

Department of Physics, Uppsala University, Box 530, S-751 21 Uppsala, Sweden

^*Corresponding author. Electronic address: alexander.foehlisch@desy.de
^†Present address: Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany.
^‡Present address: Lehrstuhl für Festkörperphysik, Universität Erlangen-Nürnberg, Staudtstrasse 7, A3, D-91058 Erlangen, Germany.