Polarity Inversion in Polar-Nonpolar-Polar Heterostructures

Sunglae Cho, Suk J. Youn, Yunki Kim, Antonio DiVenere, George K. L. Wong, Authur J. Freeman, and J. B. Ketterson
Phys. Rev. Lett. 87, 126403 – Published 3 September 2001
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Abstract

We have observed an epilayer-thickness-dependent polarity inversion for the growth of CdTe on Sb(Bi)/CdTe(111)B. For films with Sb(Bi) thicknesses of less than 40 Å (15 Å), the CdTe layer shows a B (Te-terminated) face, but it switches to an A (Cd-terminated) face for thicker layers. On the other hand, a CdTe layer grown on Bi(Sb)/CdTe(111)A always shows the A face regardless of Sb or Bi layer thicknesses. In order to address the observations we have performed ab initio calculations, which suggest that the polarity of a polar material on a nonpolar one results from the binding energy difference between the two possible surface configurations.

  • Received 1 May 2001

DOI:https://doi.org/10.1103/PhysRevLett.87.126403

©2001 American Physical Society

Authors & Affiliations

Sunglae Cho

  • Department of Physics, University of Ulsan, Ulsan, 680-749, South Korea

Suk J. Youn, Yunki Kim, Antonio DiVenere, George K. L. Wong*, Authur J. Freeman, and J. B. Ketterson

  • Department of Physics and Astronomy, Northwestern University, Evanston, Illinois 60208

  • *Permanent address: Physics Department, HKUST, Clearwater Bay, Kowloon, Hong Kong.
  • Also at Department of Electrical and Computer Engineering.

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Vol. 87, Iss. 12 — 17 September 2001

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