Coherent X-Ray Study of Fluctuations during Domain Coarsening

A. Malik; A. R. Sandy; L. B. Lurio; G. B. Stephenson; S. G. J. Mochrie; I. McNulty; M. Sutton

doi:10.1103/PhysRevLett.81.5832

Coherent X-Ray Study of Fluctuations during Domain Coarsening

A. Malik, A. R. Sandy, L. B. Lurio, G. B. Stephenson, S. G. J. Mochrie, I. McNulty, and M. Sutton

Phys. Rev. Lett. 81, 5832 – Published 28 December 1998

Abstract

We report observations of the dynamics of the exact structure factor (speckle pattern) during phase separation in a sodium borosilicate glass, measured using intensity fluctuation spectroscopy with a coherent x-ray beam. Nonequilibrium fluctuations in the structure factor are analyzed using a two-time correlation function to extract the time-dependent and wave-number-dependent correlation time. The behavior of the correlation time is in agreement with a scaling law previously found in simulations.

Received 5 August 1998

DOI:https://doi.org/10.1103/PhysRevLett.81.5832

Authors & Affiliations

A. Malik¹, A. R. Sandy², L. B. Lurio², G. B. Stephenson¹, S. G. J. Mochrie², I. McNulty³, and M. Sutton⁴

¹Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
²Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
³Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
⁴Physics Department, McGill University, Montreal, Quebec H3A 2T8 Canada