Atomic Scale Observations of Metal-Induced Gap States at {222} MgO/Cu Interfaces

D. A. Muller, D. A. Shashkov, R. Benedek, L. H. Yang, J. Silcox, and D. N. Seidman
Phys. Rev. Lett. 80, 4741 – Published 25 May 1998
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Abstract

{}222 MgO/Cu interfaces produced by internal oxidation are studied by electron energy loss spectroscopy (EELS) using an atomic sized electron beam. We determine interfacial chemistry of this interface with subnanometer spatial resolution and use EELS to measure directly the electronic states pertaining to the buried interface. O, K, and Cu L2,3 edges show the formation of metal-induced states within the band gap of MgO, at the interface (which we find to be O terminated). Both experiment and ab initio calculations find the metal-induced gap states to be strongly localized at the interface, resulting in a very small interface core-level shift.

  • Received 9 October 1997

DOI:https://doi.org/10.1103/PhysRevLett.80.4741

©1998 American Physical Society

Authors & Affiliations

D. A. Muller1,2, D. A. Shashkov3, R. Benedek3, L. H. Yang4, J. Silcox1, and D. N. Seidman3

  • 1School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
  • 2Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974
  • 3Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208
  • 4Condensed Matter Physics Division, Lawrence Livermore National Laboratory, Livermore, California 94551

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Vol. 80, Iss. 21 — 25 May 1998

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