Abstract
The nonlinear (electric field-dependent) resistivity of the 2D electron system in silicon exhibits scaling as a function of electric field and electron density in both the metallic and insulating phases, providing further evidence for a true metal-insulator transition in this 2D system at . Comparison with the temperature scaling yields separate determinations of the correlation length exponent, , and the dynamical exponent, , close to the theoretical value .
- Received 22 August 1996
DOI:https://doi.org/10.1103/PhysRevLett.77.4938
©1996 American Physical Society