Electric Field Scaling at a B=0 Metal-Insulator Transition in Two Dimensions

S. V. Kravchenko, D. Simonian, M. P. Sarachik, Whitney Mason, and J. E. Furneaux
Phys. Rev. Lett. 77, 4938 – Published 9 December 1996
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Abstract

The nonlinear (electric field-dependent) resistivity of the 2D electron system in silicon exhibits scaling as a function of electric field and electron density in both the metallic and insulating phases, providing further evidence for a true metal-insulator transition in this 2D system at B=0. Comparison with the temperature scaling yields separate determinations of the correlation length exponent, ν1.5, and the dynamical exponent, z0.8, close to the theoretical value z=1.

  • Received 22 August 1996

DOI:https://doi.org/10.1103/PhysRevLett.77.4938

©1996 American Physical Society

Authors & Affiliations

S. V. Kravchenko, D. Simonian, and M. P. Sarachik

  • Physics Department, City College of the City University of New York, New York, New York 10031

Whitney Mason and J. E. Furneaux

  • Laboratory for Electronic Properties of Materials and Department of Physics and Astronomy, University of Oklahoma, Norman, Oklahoma 73019

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Issue

Vol. 77, Iss. 24 — 9 December 1996

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