The magnetization of buried interfaces and its relationship to interfacial roughness is probed for Co films and Co/Cu multilayers using diffuse x-ray resonant magnetic scattering, a method in which the average diffusely scattered x-ray intensity is compared with the component that reflects magnetic scattering. The comparison demonstrates that the boundary between magnetic and nonmagnetic layers is smoother than the interfacial roughness, with short-wavelength roughness less effective in magnetic scattering than longer-wavelength roughness.

• Received 18 January 1996

DOI:https://doi.org/10.1103/PhysRevLett.77.3925