Subgap and above-gap differential resistance anomalies in superconductor-normal-metal microjunctions

Peng Xiong, Gang Xiao, and R. B. Laibowitz
Phys. Rev. Lett. 71, 1907 – Published 20 September 1993
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Abstract

We present the results of differential resistance (dV/dI) measurement on high-transmittance Nb-Ag (or Al) microjunctions. At low bias, dV/dI has the conventional Blonder-Tinkham-Klapwijk double-dip structure plus a sharp single dip at zero bias. This zero-bias anomaly is completely suppressed by a modification in interface. It is insensitive to magnetic field. We relate it to the electron phase-coherence effect in the proximity of superconducting gap potential Δ. Above Δ/e, dV/dI exhibits an anomalous peak, whose position is found to be proportional to Δ(T,H).

  • Received 8 June 1993

DOI:https://doi.org/10.1103/PhysRevLett.71.1907

©1993 American Physical Society

Authors & Affiliations

Peng Xiong and Gang Xiao

  • Department of Physics, Brown University, Providence, Rhode Island 02912

R. B. Laibowitz

  • IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598

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Vol. 71, Iss. 12 — 20 September 1993

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