Inverse of the Photoelectric Effect in Al

W. Drube, F. J. Himpsel, and Peter J. Feibelman
Phys. Rev. Lett. 60, 2070 – Published 16 May 1988
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Abstract

Theoretical predictions for inverse photoemission from free-electron-like materials are tested by measurement of the energy and angle dependence of the emitted photon intensity from Al. The predicted cross-section minimum at the plasma frequency ωp is observed as well as a characteristic increase below ωp due to the inverse of the surface photoelectric effect. Above ωp there is an additional bulklike contribution from the radiative decay of bulk plasmons. Other materials with a well-defined plasma resonance, e.g., Ge and Si, exhibit a similar cross-section behavior.

  • Received 9 February 1988

DOI:https://doi.org/10.1103/PhysRevLett.60.2070

©1988 American Physical Society

Authors & Affiliations

W. Drube and F. J. Himpsel

  • IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598

Peter J. Feibelman

  • Sandia National Laboratories, Albuquerque, New Mexico 87185

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Vol. 60, Iss. 20 — 16 May 1988

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