Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films

Jeffrey Collett, P. S. Pershan, Eric B. Sirota, and L. B. Sorensen
Phys. Rev. Lett. 52, 356 – Published 30 January 1984; Erratum Phys. Rev. Lett. 52, 2190 (1984)
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Abstract

The phase diagram of freely suspended thin films of heptyloxybenzylidene-heptylaniline shows dramatic changes for thicknesses below 22 layers. The most surprising feature of the phase diagram is the inclusion of two phases lacking long-range crystalline order (smectic-F and hexatic-B phases) between two crystalline phases (crystalline smectic B and smectic G). Neither the smectic F nor the hexatic B occurs in bulk samples. Between sixteen and ten layers the width, in temperature, of the hexatic-B phase increases.

  • Received 7 October 1983

DOI:https://doi.org/10.1103/PhysRevLett.52.356

©1984 American Physical Society

Erratum

Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films

Jeffrey Collett, P. S. Pershan, Eric B. Sirota, and L. B. Sorensen
Phys. Rev. Lett. 52, 2190 (1984)

Authors & Affiliations

Jeffrey Collett*, P. S. Pershan, Eric B. Sirota, and L. B. Sorensen

  • Division of Applied Sciences, Harvard University, Cambridge, Massachusetts 02138

  • *Present address: IBM Research Laboratory, Yorktown Heights, N.Y. 10598.
  • Present address: Department of Physics FM-15, University of Washington, Seattle, Wash. 98195.

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Vol. 52, Iss. 5 — 30 January 1984

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