Pressure-Induced Metal-Semiconductor Transition and 4f Electron Delocalization in Sm Te

A. Jayaraman, V. Narayanamurti, E. Bucher, and R. G. Maines
Phys. Rev. Lett. 25, 368 – Published 10 August 1970
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Abstract

The pressure variation of resistivity and optical absorption in SmTe has been studied. A continuous pressure-induced semiconductor-to-metal transition is observed, which we ascribe to the promotion of electrons from the 4f level into the conduction band as the gap between them shrinks with pressure and finally vanishes. The gap deduced from the saturation resistivity ratio ρ(P)satρ(0) is in good agreement with the gap of 0.62 ± 0.02 eV obtained from infrared absorption data.

  • Received 24 June 1970

DOI:https://doi.org/10.1103/PhysRevLett.25.368

©1970 American Physical Society

Authors & Affiliations

A. Jayaraman, V. Narayanamurti, E. Bucher, and R. G. Maines

  • Bell Telephone Laboratories, Murray Hill, New Jersey 07974

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Vol. 25, Iss. 6 — 10 August 1970

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