Temperature Dependence of Microwave Photoresistance in 2D Electron Systems

A. T. Hatke, M. A. Zudov, L. N. Pfeiffer, and K. W. West
Phys. Rev. Lett. 102, 066804 – Published 10 February 2009

Abstract

We report on the temperature dependence of microwave-induced resistance oscillations in high-mobility two-dimensional electron systems. We find that the oscillation amplitude decays exponentially with increasing temperature, as exp(αT2), where α scales with the inverse magnetic field. This observation indicates that the temperature dependence originates primarily from the modification of the single particle lifetime, which we attribute to electron-electron interaction effects.

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  • Received 4 October 2008

DOI:https://doi.org/10.1103/PhysRevLett.102.066804

©2009 American Physical Society

Authors & Affiliations

A. T. Hatke and M. A. Zudov*

  • School of Physics and Astronomy, University of Minnesota, Minneapolis, Minnesota 55455, USA

L. N. Pfeiffer and K. W. West

  • Bell Labs, Alcatel-Lucent, Murray Hill, New Jersey 07974, USA

  • *Corresponding author. zudov@physics.umn.edu

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Vol. 102, Iss. 6 — 13 February 2009

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