Abstract
Analysis and experimental tests have been carried out on a dielectrically lined waveguide, which appears to be a suitable structure for accelerating electrons. From the dispersion relation for the mode, inner and outer radii of a copper-clad alumina pipe (ɛ=9.40) have been determined such that the phase and group velocities are 0.9732c and 0.1096c, respectively. Analysis and particle simulation studies for the injection of 6-MeV microbunches from a 2.856-GHz rf gun, and subsequent acceleration by the fields, predict that an acceleration gradient of 6.3 Mv/m can be achieved with a traveling-wave power of 15 MW applied to the structure. Synchronous injection into a narrow phase window is shown to allow trapping of all injected particles. The rf fields of the accelerating structure are shown to provide radial focusing, so that longitudinal and transverse emittance growth during acceleration is small and that no external magnetic fields are required for focusing. The acceleration mechanism is the inverse of that in which electrons radiate as they traverse a waveguide at speeds exceeding the phase velocity of the microwaves (Čerenkov radiation) and is thus referred to as a microwave inverse Čerenkov accelerator. For 0.16-nC, 5-psec microbunches, the normalized emittance of the accelerated beam is predicted to be less than 5π mm mrad. Experiments on sample alumina tubes have been conducted that verify the theoretical dispersion relation for the mode over a two-to-one range in frequency. No excitation of axisymmetric or nonaxisymmetric competing waveguide modes was observed. High power tests showed that tangential electric fields at the inner surface of an uncoated sample of alumina pipe could be sustained up to 8.4 MV/m without breakdown. These considerations suggest that a microwave inverse Čerenkov test accelerator can be built to examine these predictions using an available rf power source, a 6-MeV rf gun, and an associated beam line. © 1996 The American Physical Society.
- Received 22 March 1996
DOI:https://doi.org/10.1103/PhysRevE.54.1918
©1996 American Physical Society