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Quantitative molecular interpretation of curvature elasticity of saturated surfactant monolayers

Hyung-June Woo, Carlo Carraro, and David Chandler
Phys. Rev. E 53, R41(R) – Published 1 January 1996
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Abstract

The charge-frustrated model of self assembly is applied to compute the curvature elasticity of saturated surfactant interfaces in bicontinuous microemulsions. Explicit formulas are derived to relate the elastic moduli to molecular properties such as surfactant chain length. © 1996 The American Physical Society.

  • Received 21 September 1995

DOI:https://doi.org/10.1103/PhysRevE.53.R41

©1996 American Physical Society

Authors & Affiliations

Hyung-June Woo, Carlo Carraro, and David Chandler

  • Department of Chemistry, University of California, Berkeley, California 94720

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Vol. 53, Iss. 1 — January 1996

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