• Open Access

Threshold factorization redux

Junegone Chay and Chul Kim
Phys. Rev. D 97, 094024 – Published 22 May 2018

Abstract

We reanalyze the factorization theorems for the Drell-Yan process and for deep inelastic scattering near threshold, as constructed in the framework of the soft-collinear effective theory (SCET), from a new, consistent perspective. In order to formulate the factorization near threshold in SCET, we should include an additional degree of freedom with small energy, collinear to the beam direction. The corresponding collinear-soft mode is included to describe the parton distribution function (PDF) near threshold. The soft function is modified by subtracting the contribution of the collinear-soft modes in order to avoid double counting on the overlap region. As a result, the proper soft function becomes infrared finite, and all the factorized parts are free of rapidity divergence. Furthermore, the separation of the relevant scales in each factorized part becomes manifest. We apply the same idea to the dihadron production in e+e annihilation near threshold, and show that the resultant soft function is also free of infrared and rapidity divergences.

  • Figure
  • Figure
  • Received 10 October 2017

DOI:https://doi.org/10.1103/PhysRevD.97.094024

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI. Funded by SCOAP3.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Particles & Fields

Authors & Affiliations

Junegone Chay1,2,* and Chul Kim3,†

  • 1Department of Physics, Korea University, Seoul 02841, Korea
  • 2Fields, Gravity & Strings, CTPU, Institute for Basic Science, Seoul 08826, Korea
  • 3Institute of Convergence Fundamental Studies and School of Liberal Arts, Seoul National University of Science and Technology, Seoul 01811, Korea

  • *chay@korea.ac.kr
  • chul@seoultech.ac.kr

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Issue

Vol. 97, Iss. 9 — 1 May 2018

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