Calculation of divergent photon absorption in ultrathin films of a topological insulator

Jing Wang, Hideo Mabuchi, and Xiao-Liang Qi
Phys. Rev. B 88, 195127 – Published 15 November 2013

Abstract

We perform linear and nonlinear photon absorption calculations in ultrathin films of a topological insulator on a substrate. Due to the unique band structure of the coupled topological surface states, novel features are observed for suitable photon frequencies, including a divergent edge singularity in the one-photon absorption process and a significant enhancement in the two-photon absorption process. The resonant frequencies can be controlled by tuning the energy difference and coupling the top and bottom surface states. Such unique linear and nonlinear optical properties make ultrathin films of topological insulators promising material building blocks for tunable high-efficiency nanophotonic devices.

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  • Received 3 October 2012

DOI:https://doi.org/10.1103/PhysRevB.88.195127

©2013 American Physical Society

Authors & Affiliations

Jing Wang1,*, Hideo Mabuchi2, and Xiao-Liang Qi1

  • 1Department of Physics, McCullough Building, Stanford University, Stanford, California 94305-4045, USA
  • 2Department of Applied Physics, Stanford University, Stanford, California 94305-4045, USA

  • *wjing01@gmail.com

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Vol. 88, Iss. 19 — 15 November 2013

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