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Structural origins of the properties of rare earth nickelate superlattices

Jinwoo Hwang, Junwoo Son, Jack Y. Zhang, Anderson Janotti, Chris G. Van de Walle, and Susanne Stemmer
Phys. Rev. B 87, 060101(R) – Published 13 February 2013
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Abstract

NiO6 octahedral tilts in the LaNiO3/SrTiO3 superlattices are quantified using position averaged convergent beam electron diffraction in scanning transmission electron microscopy. It is shown that maintaining oxygen octahedra connectivity across the interface controls the octahedral tilts in the LaNiO3 layers, their lattice parameters, and their transport properties. Unlike films and layers that are connected on one side to the substrate, subsequent LaNiO3 layers in the superlattice exhibit a relaxation of octahedral tilts towards bulk values. This relaxation is facilitated by tilts in the SrTiO3 layers and is correlated with the conductivity enhancement of the LaNiO3 layers in the superlattices relative to individual films.

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  • Received 26 November 2012

DOI:https://doi.org/10.1103/PhysRevB.87.060101

©2013 American Physical Society

Authors & Affiliations

Jinwoo Hwang*, Junwoo Son, Jack Y. Zhang, Anderson Janotti, Chris G. Van de Walle, and Susanne Stemmer

  • Materials Department, University of California, Santa Barbara, California 93106-5050, USA

  • *jhwang@mrl.ucsb.edu
  • stemmer@mrl.ucsb.edu

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Issue

Vol. 87, Iss. 6 — 1 February 2013

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