• Editors' Suggestion

Pseudospin transfer torques in semiconductor electron bilayers

Youngseok Kim, A. H. MacDonald, and Matthew J. Gilbert
Phys. Rev. B 85, 165424 – Published 12 April 2012

Abstract

We use self-consistent quantum transport theory to investigate the influence of electron-electron interactions on interlayer transport in semiconductor electron bilayers in the absence of an external magnetic field. We conclude that, even though spontaneous pseudospin order does not occur at zero field, interaction-enhanced quasiparticle tunneling amplitudes and pseudospin transfer torques do alter tunneling I-V characteristics, and can lead to time-dependent response to a dc bias voltage.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 26 January 2012

DOI:https://doi.org/10.1103/PhysRevB.85.165424

©2012 American Physical Society

Authors & Affiliations

Youngseok Kim1,*, A. H. MacDonald2, and Matthew J. Gilbert1,†

  • 1Department of Electrical and Computer Engineering, University of Illinois, Urbana, Illinois, 61801, USA
  • 2Department of Physics, University of Texas at Austin, Austin, Texas 78712, USA

  • *Present address: Micro and Nanotechnology Laboratory, University of Illinois, Urbana, Illinois 61801, USA.
  • Present address: Micro and Nanotechnology Laboratory, University of Illinois, Urbana, Illinois 61801, USA; Beckman Institute, University of Illinois, Urbana, Illinois 61801, USA; Institute for Condensed Matter Theory, University of Illinois, Urbana, Illinois 61801, USA.

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 85, Iss. 16 — 15 April 2012

Reuse & Permissions
Access Options
CHORUS

Article Available via CHORUS

Download Accepted Manuscript
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×