Abstract
High quality films of EuO and EuGdO were grown on -type Si(100) via pulsed laser deposition. X-ray-diffraction results show that the addition of Gd changes the growth texture from [001] to [111]. Angular-resolved photoemission spectroscopy reveals electron pockets around the points in Gd-doped EuO, indicating that the band gap in EuO is indirect. Combined photoemission and inverse photoemission measurements show an apparent transition from -type to -type behavior, which is likely due to band bending near the polar (111) surface.
2 More- Received 2 August 2011
DOI:https://doi.org/10.1103/PhysRevB.85.014406
©2012 American Physical Society