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Measurements of the Einstein relation in doped and undoped molecular thin films

O. Tal, I. Epstein, O. Snir, Y. Roichman, Y. Ganot, C. K. Chan, A. Kahn, N. Tessler, and Y. Rosenwaks
Phys. Rev. B 77, 201201(R) – Published 2 May 2008

Abstract

We present the Kelvin probe force microscopy measurements of the Einstein relation, i.e., the relation between the diffusion coefficient of charge carriers and their mobility, in undoped and doped disordered organic thin films. The theoretical prediction of a large deviation of the Einstein relation from its classical value is verified and attributed to the energy distribution of the density of states. The results are explained in the context of degeneracy effects on the transport in disordered organic thin films, and their implications for organic-based devices are discussed.

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  • Received 13 February 2008

DOI:https://doi.org/10.1103/PhysRevB.77.201201

©2008 American Physical Society

Authors & Affiliations

O. Tal1,*, I. Epstein1, O. Snir1, Y. Roichman2,†, Y. Ganot2, C. K. Chan3, A. Kahn3, N. Tessler2, and Y. Rosenwaks1

  • 1School of Electrical Engineering-Physical Electronics, Tel Aviv University, Tel Aviv 69978, Israel
  • 2Department of Electrical Engineering, Technion Israel institute of Technology, Haifa 32000, Israel
  • 3Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA

  • *Present address: Leiden Institute of Physics, Leiden University, 2300 RA Leiden, Netherlands.
  • Present address: Department of Physics, New York University, New York 10003, USA.

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Issue

Vol. 77, Iss. 20 — 15 May 2008

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