Time-varying tip-sample force measurements and steady-state dynamics in tapping-mode atomic force microscopy

Ozgur Sahin
Phys. Rev. B 77, 115405 – Published 5 March 2008
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Abstract

Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here, we report experimental evidence that the mathematical relationships describing the steady-state dynamics are quantitatively satisfied by the independent measurements of tip-sample forces over a broad range of experimental conditions. These results confirm the existing understanding of tapping-mode atomic force microscopy and build confidence on the reliability of time-varying tip-sample force measurements by the torsional harmonic cantilevers.

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  • Received 28 October 2007

DOI:https://doi.org/10.1103/PhysRevB.77.115405

©2008 American Physical Society

Authors & Affiliations

Ozgur Sahin*

  • The Rowland Institute at Harvard, Harvard University, Cambridge, Massachusetts 02142, USA

  • *sahin@rowland.harvard.edu

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Issue

Vol. 77, Iss. 11 — 15 March 2008

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