Frequency quenching of microwave-induced resistance oscillations in a high-mobility two-dimensional electron gas

S. A. Studenikin, A. S. Sachrajda, J. A. Gupta, Z. R. Wasilewski, O. M. Fedorych, M. Byszewski, D. K. Maude, M. Potemski, M. Hilke, K. W. West, and L. N. Pfeiffer
Phys. Rev. B 76, 165321 – Published 30 October 2007

Abstract

The frequency dependence of microwave-induced resistance oscillations (MIROs) has been studied experimentally in high-mobility electron GaAsAlGaAs structures to explore the limits at which these oscillations can be observed. It is found that in dc transport experiments at frequencies above 120GHz, MIROs start to quench, while above 230GHz, they completely disappear. The results will need to be understood theoretically but are qualitatively discussed within a model in which forced electronic charge oscillations (plasmons) play an intermediate role in the interaction process between the radiation and the single-particle electron excitations between Landau levels.

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  • Received 8 June 2007

DOI:https://doi.org/10.1103/PhysRevB.76.165321

©2007 American Physical Society

Authors & Affiliations

S. A. Studenikin*, A. S. Sachrajda, J. A. Gupta, and Z. R. Wasilewski

  • Institute for Microstructural Sciences, National Research Council, Ottawa, Ontario, Canada K1A-0R6

O. M. Fedorych, M. Byszewski, D. K. Maude, and M. Potemski

  • High Magnetic Field Laboratory, MPI/FKF and CNRS, Grenoble 38-042, France

M. Hilke

  • Department of Physics, McGill University, Montreal, Canada H3A-2T8

K. W. West and L. N. Pfeiffer

  • Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974-0636, USA

  • *sergei.studenikin@nrc.ca

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Vol. 76, Iss. 16 — 15 October 2007

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