Determination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy

I. Kuznetsova, T. Meier, S. T. Cundiff, and P. Thomas

Phys. Rev. B 76, 153301 – Published 2 October 2007

Abstract

The imaginary part of two-dimensional Fourier-transform spectra in the rephasing and nonrephasing modes is used to analyze the homogeneous and inhomogeneous broadening of excitonic resonances in semiconductor nanostructures. Microscopic calculations that include heavy- and light-hole excitons as well as coherent biexcitonic many-body correlations reveal distinct differences between the rephasing and nonrephasing spectra. A procedure is proposed that allows separation of disorder-induced broadening in complex systems that show several coupled resonances.

Received 12 April 2007

DOI:https://doi.org/10.1103/PhysRevB.76.153301

Authors & Affiliations

I. Kuznetsova¹, T. Meier^1,2, S. T. Cundiff³, and P. Thomas¹

¹Department of Physics and Material Sciences Center, Philipps University, Renthof 5, D-35032 Marburg, Germany
²Department Physik, Fakultät für Naturwissenschaften, Universität Paderborn, Warburger Strasse 100, D-33098 Paderborn, Germany
³JILA, University of Colorado and National Institute of Standards and Technology, Boulder, Colorado 80309-0440, USA

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Vol. 76, Iss. 15 — 15 October 2007

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Physical Review B

covering condensed matter and materials physics