Abstract
- Received 10 October 2007
DOI:https://doi.org/10.1103/PhysRevB.76.149905
©2007 American Physical Society
Erratum: Growth and microstructure dependence of electronic and magnetic properties in magnetically doped Gd-Si amorphous semiconductors [Phys. Rev. B 75, 184404 (2007)]
Li Zeng, Erik Helgren, Frances Hellman, Rafiqul Islam, and David J. Smith
Phys. Rev. B 76, 149905 – Published 31 October 2007
Images
Figure 1
XTEM micrographs for an (a) -beam-evaporated sample, (b) sputtered sample prepared at , and (c) sputtered sample prepared at . Note the differences in film morphology. Insets for each are HR-XTEM micrographs.Reuse & Permissions