The electronic structure of the tin oxides SnO and $\mathrm{Sn}{\mathrm{O}}_2$ is studied using the fine structure of the $\mathrm{Sn}\text{–}{M}_{4,5}$ and oxygen $K$-edges measured by electron energy loss spectroscopy (EELS). The experimental results are compared with real-space multiple scattering calculations. It is observed that both edges are overlapped. The calculations reveal that the observed fine structure is due largely to the oxygen states, and that it can be used to fingerprint each phase. The calculated densities of states are similar for both compounds and suggest a covalent nature. The structures appearing within the first $10\mathrm{eV}$ above the threshold arise from a covalent mixing of mainly O $2p$ and Sn $5s\text{−}p$. For SnO the oxygen edge is satisfactorily reproduced. Discrepancies in the predicted energy position of the features in the EELS of $\mathrm{Sn}{\mathrm{O}}_2$ are briefly discussed.

• Received 22 June 2004

DOI:https://doi.org/10.1103/PhysRevB.71.035103