Depth profile of iron in a CaB6 crystal

Chandana Meegoda, Michael Trenary, Takao Mori, and Shigeki Otani
Phys. Rev. B 67, 172410 – Published 30 May 2003
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Abstract

Scanning electron microscopy, energy dispersive x-ray spectroscopy, and depth profiling with Auger electron spectroscopy were used to characterize surface iron present on a CaB6 single crystal. The crystal was grown by the aluminum flux method and displayed ferromagnetism at 300 K. For similarly prepared samples, treatment with hydrochloric acid eliminated the ferromagnetism. In previous work it was speculated that the iron is deposited onto the CaB6 surface during flux removal. The Auger depth profiles presented here reveals that the iron is indeed concentrated in the surface region.

  • Received 17 January 2003

DOI:https://doi.org/10.1103/PhysRevB.67.172410

©2003 American Physical Society

Authors & Affiliations

Chandana Meegoda and Michael Trenary

  • Department of Chemistry, University of Illinois at Chicago, 845 West Taylor Street, Chicago, Illinois 60607-7061

Takao Mori and Shigeki Otani

  • National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

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Issue

Vol. 67, Iss. 17 — 1 May 2003

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