Electronic structure of carbon nanotubes studied by photoelectron spectromicroscopy

S. Suzuki, Y. Watanabe, T. Ogino, S. Heun, L. Gregoratti, A. Barinov, B. Kaulich, M. Kiskinova, W. Zhu, C. Bower, and O. Zhou
Phys. Rev. B 66, 035414 – Published 22 July 2002
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Abstract

The electronic structure of multiwalled carbon nanotubes aligned perpendicularly on a Si substrate was studied by means of photoelectron spectromicroscopy. The valence band and the C 1s spectra, measured systematically from spatially selected regions along the tube axes, were the fingerprint for lateral variations in the electron density of states and in the band bending, respectively. It was found that the tips have a larger density of states near the Fermi level than the sidewalls, whereas band bending, which would explain such a spectral difference, was not observed. It is suggested that the different density of states near the Fermi level is due to a larger dangling bond density at the tips.

  • Received 2 February 2002

DOI:https://doi.org/10.1103/PhysRevB.66.035414

©2002 American Physical Society

Authors & Affiliations

S. Suzuki*, Y. Watanabe, and T. Ogino

  • NTT Basic Research Laboratories, Atsugi, Kanagawa, 243-0198 Japan

S. Heun, L. Gregoratti, A. Barinov, B. Kaulich, and M. Kiskinova

  • Sincrotrone Trieste, Basovizza, 34012 Trieste, Italy

W. Zhu

  • Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974

C. Bower and O. Zhou

  • Department of Physics and Astronomy and Curriculum in Applied and Materials Science, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599

  • *Email address: ssuzuki@will.brl.ntt.co.jp
  • Present address: Inplane Photonics, South Plainfield, NJ 07080.

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Vol. 66, Iss. 3 — 15 July 2002

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