X-ray scattering study of two length scales in the critical fluctuations of CuGeO3

Y. J. Wang, Y.-J. Kim, R. J. Christianson, S. C. LaMarra, F. C. Chou, and R. J. Birgeneau
Phys. Rev. B 63, 052502 – Published 5 January 2001
PDFExport Citation

Abstract

The critical fluctuations of CuGeO3 have been measured by synchrotron x-ray scattering, and two length scales are clearly observed. The ratio between the two length scales is found to be significantly different along the a axis, with the a axis along the surface normal direction. We believe that such a directional preference is a clear sign that random surface strains, especially those caused by dislocations, are the origin of the long length scale fluctuations.

  • Received 20 April 2000

DOI:https://doi.org/10.1103/PhysRevB.63.052502

©2001 American Physical Society

Authors & Affiliations

Y. J. Wang, Y.-J. Kim, R. J. Christianson, S. C. LaMarra, F. C. Chou, and R. J. Birgeneau

  • Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

References (Subscription Required)

Click to Expand
Issue

Vol. 63, Iss. 5 — 1 February 2001

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×