Connections between the electron-energy-loss spectra, the local electronic structure, and the physical properties of a material: A study of nickel aluminum alloys

David A. Muller, David J. Singh, and John Silcox
Phys. Rev. B 57, 8181 – Published 1 April 1998
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Abstract

The local electronic structure of a material can be determined from the energy-loss spectrum of a swift electron beam scattered through it. When the electron beam is focused down to the width of an atomic column, the electronic density of states (DOS) at an interface, grain boundary, or impurity site can be decomposed by site, chemical species and angular momentum. Here we discuss the use of electron-energy-loss spectroscopy (EELS) fine structure to provide insight into the origin of grain boundary and interfacial properties reported earlier [D. A. Muller et al., Phys. Rev. Lett. 75, 4744 (1995)] for Ni3Al. We examine the electronic structure trends in Ni-Al compounds, both experimentally with the EELS measurements and theoretically, using ab initio band-structure calculations. The conditions under which the band-structure calculations can quantitatively reproduce the EELS measurements (and in particular, the question of just which local DOS is being measured) are addressed. Cyrot-Lackmann’s moments theorem provides a framework to explain the systematic changes in the local DOS on alloying. The shape changes in the near-edge fine structure of both the Ni and Al L edges are readily understood by the sensitivity of the fourth moment of the local DOS to the angular character of the Ni-Al bonding. The language of bond-order potentials proved useful in linking shape changes in the DOS to changes in cohesion. The consequences for formation energies and ordering trends in the transition-metal–aluminum alloys are also discussed.

  • Received 13 May 1997

DOI:https://doi.org/10.1103/PhysRevB.57.8181

©1998 American Physical Society

Authors & Affiliations

David A. Muller

  • School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
  • Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974

David J. Singh

  • Naval Research Laboratories, Code 6691, Washington, DC 20375

John Silcox

  • School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853

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Vol. 57, Iss. 14 — 1 April 1998

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