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X-ray diffuse-scattering study of interfacial morphology and conformal roughness in metallic multilayers

R. Paniago, H. Homma, P. C. Chow, S. C. Moss, Z. Barnea, S. S. P. Parkin, and D. Cookson
Phys. Rev. B 52, R17052(R) – Published 15 December 1995
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Abstract

The nature of the interfacial roughness in Ni0.81Fe0.19/Au multilayers was studied using x-ray diffuse scattering. Using an image-plate detector this scattering could be observed to an extended momentum transfer. The roughness exponent and the cutoff length of the interfacial height-height self-correlation function could thereby be determined using a model of conformal roughness, for which the interfaces are smooth within the cutoff length. We also show that while the roughness is not conformal for short length scales, a transition to conformal behavior occurs from ∼25 to 100 Å.

  • Received 4 October 1995

DOI:https://doi.org/10.1103/PhysRevB.52.R17052

©1995 American Physical Society

Authors & Affiliations

R. Paniago, H. Homma, P. C. Chow, and S. C. Moss

  • Department of Physics, University of Houston, Houston, Texas 77204-5506

Z. Barnea

  • School of Physics, University of Melbourne, Parkville, Victoria 3052, Australia

S. S. P. Parkin

  • IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099

D. Cookson

  • Australian Nuclear Science and Technology Organisation, Private Mail Bag 1, Menal 2234, Australia

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Issue

Vol. 52, Iss. 24 — 15 December 1995

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