Scanning-tunneling-microscopy studies of disilane adsorption and pyrolytic growth on Si(100)-(2x1)

D.-S. Lin, E. S. Hirschorn, T.-C. Chiang, R. Tsu, D. Lubben, and J. E. Greene
Phys. Rev. B 45, 3494 – Published 15 February 1992
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Abstract

Scanning tunneling microscopy has been employed to study the adsorption of disilane (Si2H6) and pyrolytic growth on Si(100)-(2×1) at various temperatures. Room-temperature exposures result in a random distribution of dissociation fragments on the surface. Formation of anisotropic monohydride islands and denuded zones as well as island coarsening is observed at higher temperatures. The results are strikingly similar to those reported for growth by molecular-beam epitaxy using pure Si, even though different surface reactions are involved in these two growth processes.

  • Received 19 August 1991

DOI:https://doi.org/10.1103/PhysRevB.45.3494

©1992 American Physical Society

Authors & Affiliations

D.-S. Lin, E. S. Hirschorn, and T.-C. Chiang

  • Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801

R. Tsu, D. Lubben, and J. E. Greene

  • Department of Materials Science, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
  • Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801

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Vol. 45, Iss. 7 — 15 February 1992

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