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Electron interactions in the two-dimensional electron-gas base of a vertical hot-electron transistor

P. Matthews, M. J. Kelly, V. J. Law, D. G. Hasko, M. Pepper, W. M. Stobbs, H. Ahmed, D. C. Peacock, J. E. F. Frost, D. A. Ritchie, and G. A. C. Jones
Phys. Rev. B 42, 11415(R) – Published 15 December 1990
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Abstract

We present results on the interaction of hot and cold electrons in a large-area two-dimensional electron-gas-base hot-electron transistor. Four-terminal magnetoresistance measurements of the cold electrons in the two-dimensional electron-gas (2DEG) base, as a function of forward-emitter bias, VEB, show significant deviations from the zero-bias condition. We identify two distinct regimes: (i) an enhanced interface scattering as the 2DEG is forced against the collector-barrier heterojunction for low biases before emitter-current injection and (ii) an electron-heating effect in the 2DEG once current injection occurs. We invoke a simple heat-exchange argument to analyze the relaxation of the injected hot carriers.

  • Received 20 June 1990

DOI:https://doi.org/10.1103/PhysRevB.42.11415

©1990 American Physical Society

Authors & Affiliations

P. Matthews, M. J. Kelly, V. J. Law, D. G. Hasko, and M. Pepper

  • Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 OHE, Cambridgeshire, United Kingdom

W. M. Stobbs

  • Department of Metallurgy and Materials Science, University of Cambridge, Cambridge CB2 3QZ, Cambridgeshire, United Kingdom

H. Ahmed, D. C. Peacock, J. E. F. Frost, D. A. Ritchie, and G. A. C. Jones

  • Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 OHE, Cambridgeshire, United Kingdom

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Vol. 42, Iss. 17 — 15 December 1990

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