Theory of Be-induced defects in Si

Eugen Tarnow, S. B. Zhang, K. J. Chang, and D. J. Chadi
Phys. Rev. B 42, 11252 – Published 15 December 1990
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Abstract

The total energies and structures of a number of Be-induced defects in Si are investigated using ab initio local-density calculations. Our primary results are (1) the geometry of the isoelectronic center is found to correspond to a [111] substitutional-interstitial pair; (2) at normal doping temperatures the solubility of single Be interstitials is exceedingly low; (3) the low-energy defect spectrum includes large Be complexes containing at least one substitutional atom; and (4) the Be-Be bond in these larger complexes is metastable, while the Si-Be bond is stable for all defect configurations.

  • Received 6 July 1990

DOI:https://doi.org/10.1103/PhysRevB.42.11252

©1990 American Physical Society

Authors & Affiliations

Eugen Tarnow, S. B. Zhang, K. J. Chang, and D. J. Chadi

  • Electronic Materials Laboratory, Xerox Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, California 94304

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Vol. 42, Iss. 17 — 15 December 1990

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