Electronic structure of InP/Ga0.47In0.53As interfaces

Maria Peressi, Stefano Baroni, Alfonso Baldereschi, and Raffaele Resta
Phys. Rev. B 41, 12106 – Published 15 June 1990
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Abstract

The electronic structure of lattice-matched InP/Ga0.47In0.53As heterojunctions has been studied for the three main crystallographic orientations (001), (110), and (111), using state-of-the-art local-density techniques, and treating the GaxIn1xAs alloy by the virtual-crystal approximation. The valence-band offset does not depend on the crystallographic orientation within our numerical accuracy (≅ 10 meV). Our results and, in particular, the orientation independence of the band offset are examined within a linear-response approach in which the interface is treated as a perturbation with respect to an average, periodic crystal. This approach also allows us to describe in a physically sound and quantitatively accurate way the effects of interfacial strain. The effects of disorder-induced and electron-correlation-induced self-energies are also briefly discussed.

  • Received 15 February 1990

DOI:https://doi.org/10.1103/PhysRevB.41.12106

©1990 American Physical Society

Authors & Affiliations

Maria Peressi and Stefano Baroni

  • Scuola Internazionale Superiore di Studi Avanzati (SISSA), Strada Costiera 11, I-34014 Trieste, Italy

Alfonso Baldereschi* and Raffaele Resta

  • Institut Romand de Recherche Numérique en Physique des Matériaux (IRRMA), PHB Ecublens, CH-1015, Lausanne, Switzerland

  • *Also at Dipartimento di Fisica Teorica, Università di Trieste, Strada Costiera 11, I-34014 Trieste, Italy.
  • Permanent address: SISSA, Trieste, Italy.

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Vol. 41, Iss. 17 — 15 June 1990

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