Film thinning in unsaturated superfluid He4 films during persistent flow

D. T. Ekholm and R. B. Hallock
Phys. Rev. B 19, 2485 – Published 1 March 1979
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Abstract

We report measurements of the thickness of unsaturated superfluid He4 films in persistent flow as a function of persistent current velocity. Our results are in quantitative agreement with the predictions of Kontorovich, and thus disagree with the conclusion of Rudnick and coworkers that ρsρ has an enhanced velocity dependence in these films.

  • Received 9 August 1978

DOI:https://doi.org/10.1103/PhysRevB.19.2485

©1979 American Physical Society

Authors & Affiliations

D. T. Ekholm

  • Department of Physics and Astronomy, University of Massachusetts, Amherst, Massachusetts 01003

R. B. Hallock*

  • Laboratory for Atomic and Solid-State Physics, Cornell University, Ithaca, New York 14853 and Department of Physics and Astronomy, University of Massachusetts, Amherst, Massachusetts 01003

  • *Permanent address: Dept. of Physics and Astronomy, University of Massachusetts, Amherst, MA 01003.

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Vol. 19, Iss. 5 — 1 March 1979

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