Spin transmission in IrMn through measurements of spin Hall magnetoresistance and spin-orbit torque

Xiao Wang, Caihua Wan, Yizhou Liu, Qiming Shao, Hao Wu, Chenyang Guo, Chi Fang, Yao Guang, Wenlong Yang, Congli He, Bingshan Tao, Xiaomin Zhang, Tianyi Ma, Jing Dong, Yu Zhang, Jiafeng Feng, Jiang Xiao, Kang L. Wang, Guoqiang Yu, and Xiufeng Han
Phys. Rev. B 101, 144412 – Published 8 April 2020

Abstract

Understanding the transport of spin current in antiferromagnetic materials is indispensable to develop antiferromagnetic spintronic devices. In this work, we study the spin current transmission through an antiferromagnetic IrMn insertion layer in a W/IrMn(t)/CoFeB structure by measuring the spin Hall magnetoresistance (SMR) and spin-orbit torque (SOT). The temperature dependences of SMR and SOT effective fields indicate that the spin current transmission reaches its maximum at the Néel temperature of IrMn. The enhancement is ascribed to the increase in the interfacial spin mixing conductance, which is related to the maximum magnetic susceptibility of the IrMn layer at the Néel temperature. The spin transmission decreases monotonically as a function of the IrMn thickness, which is different from the case with an insulating antiferromagnetic NiO insertion layer in previous works. In addition, we found that the spin transmission through an antiferromagnetic IrMn layer is independent of the exchange bias orientation. Our results suggest that the spin current transmission through the IrMn layer (from W layer to CoFeB layer) is mainly mediated by spin-polarized electrons rather than magnons, which is likely due to the absence of the effective excitation of magnons in the IrMn layer by the spin-polarized current.

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  • Received 9 February 2020
  • Revised 17 March 2020
  • Accepted 17 March 2020

DOI:https://doi.org/10.1103/PhysRevB.101.144412

©2020 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Xiao Wang1,2, Caihua Wan1,2, Yizhou Liu1,2, Qiming Shao3, Hao Wu3, Chenyang Guo1,2, Chi Fang1,2, Yao Guang1,2, Wenlong Yang1,2, Congli He4, Bingshan Tao1,5, Xiaomin Zhang1,2, Tianyi Ma1,2, Jing Dong1,2, Yu Zhang1,2, Jiafeng Feng1,2, Jiang Xiao6, Kang L. Wang3, Guoqiang Yu1,2,7,*, and Xiufeng Han1,2,7

  • 1Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Device Research Laboratory, Department of Electrical Engineering, University of California, Los Angeles, California 90095, USA
  • 4Institute of Advanced Materials, Beijing Normal University, Beijing 100875, China
  • 5Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing 100190, China
  • 6Department of Physics and State Key Laboratory of Surface Physics, Fudan University, Shanghai 200433, China
  • 7Songshan Lake Materials Laboratory, Dongguan, Guangdong 523808, China

  • *Corresponding author: guoqiangyu@iphy.ac.cn

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Vol. 101, Iss. 14 — 1 April 2020

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