Abstract
With a trapped-ion hyperfine-state qubit, we demonstrate an error probability per randomized single-qubit gate of , below the threshold estimate of commonly considered sufficient for fault-tolerant quantum computing. The ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.
- Received 18 May 2011
DOI:https://doi.org/10.1103/PhysRevA.84.030303
Published by the American Physical Society