Measurement of atomic diffraction phases induced by material gratings

John D. Perreault and Alexander D. Cronin
Phys. Rev. A 73, 033610 – Published 15 March 2006

Abstract

Atom-surface interactions can significantly modify the intensity and phase of atom de Broglie waves diffracted by a silicon nitride grating. This affects the operation of a material grating as a coherent beam splitter. The phase shifts induced by diffraction are measured by comparing the relative phases of several interfering paths in a Mach-Zehnder Na atom interferometer formed by three material gratings. The values of the diffraction phases are consistent with a simple model which includes a van der Waals atom-surface interaction between the Na atoms and the silicon nitride grating bars.

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  • Received 24 August 2005

DOI:https://doi.org/10.1103/PhysRevA.73.033610

©2006 American Physical Society

Authors & Affiliations

John D. Perreault and Alexander D. Cronin

  • Department of Physics, University of Arizona, Tucson, Arizona 85721, USA

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Issue

Vol. 73, Iss. 3 — March 2006

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