• Open Access

Ultrashort electron bunch length measurement with diffraction radiation deflector

Dao Xiang and Wen-Hui Huang
Phys. Rev. ST Accel. Beams 10, 012801 – Published 4 January 2007

Abstract

In this paper, we propose a novel method to measure electron bunch length with a diffraction radiation (DR) deflector which is composed of a DR radiator and three beam position monitors (BPMs). When an electron beam passes through a metallic aperture which is tilted by 45 degrees with respect to its trajectory, backward DR that propagates perpendicular to the beam’s trajectory is generated which adds a transverse deflection to the beam as a result of momentum conservation. The deflection is found to be largely dependent on the bunch length and could be easily observed with a downstream BPM. Detailed investigations show that this method has wide applicability, high temporal resolution, and great simplicity.

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  • Received 4 December 2006

DOI:https://doi.org/10.1103/PhysRevSTAB.10.012801

This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Authors & Affiliations

Dao Xiang* and Wen-Hui Huang

  • Department of Engineering Physics, Tsinghua University, Beijing, China, 100084

  • *Corresponding author. Electronic address: xiangdao@tsinghua.org.cn

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Vol. 10, Iss. 1 — January 2007

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