Figure 1

(a) Schematic of the surface patterning through microcontact printing routine. (b) Casting of nanotube solution on tilted patterned substrate. (c) Dip coating.Reuse & Permissions

Figure 2

AFM topographical [(a), (c)–(f)] and phase (b) images of different types of patterned surface arrays of woven and combed nanotube arrays formed by casting [(a), (b), (c), (f)] and by dip coating [(d), (e)]. (a) Woven nanotube arrays on parallel stripes, $50\times 50\mu \mathrm{m}$; top inset shows microstructure of a single stripe ($10\times 10\mu \mathrm{m}$); bottom inset shows 2D Fourier-transform demonstrating perfect spacing and vertical ordering; $Z$ scale is 40 nm. (b) High resolution ($2\times 2\mu \mathrm{m}$) phase image of a highly oriented straight carbon nanotube array within a single stripe; inset shows 2D Fourier transform demonstrating a high level of orientation nematic ordering; $Z$ scale is $10°$. (c) Image of an individual stripe ($10\times 10\mu \mathrm{m}$) with a complex chevron type of oriented nanotubes; $Z$ scale is 20 nm. (d) Combed nanotube monolayer showing long-range orientation of bent tubes uniformly oriented within stripes; $Z$ scale is 20 nm. (e) Selected surface areas with tethered carbon nanotubes in “noose” shapes. Marked areas show identically looped nanotubes; $Z$ scale is 20 nm. (f) Woven nanotube arrays on a rectangular pattern, $50\times 50\mu \mathrm{m}$; $Z$ scale is 80 nm. The bottom inset shows 2D Fourier transform demonstrating perfect positional ordering of arrays. The top inset shows the “nest” shape of an individual array with nanotube bundles predominantly bent and aligned along the edges.Reuse & Permissions

Figure 3

High-resolution 3D images of looped nanotubes and cross-sectional profile along the bent nanotube (red marks indicate depth of 2.0 nm). $Z$ scale is 20 nm.Reuse & Permissions

Figure 4

Schematic of the suggested mechanism of pinned nanotube bending by a moving receding front of a drying droplet.Reuse & Permissions