Staircase in the Electron Mobility of a ZnO Quantum Dot Assembly due to Shell Filling

A. L. Roest, J. J. Kelly, D. Vanmaekelbergh, and E. A. Meulenkamp
Phys. Rev. Lett. 89, 036801 – Published 27 June 2002
PDFExport Citation

Abstract

Electron transport in an assembly of ZnO quantum dots has been studied using an electrochemically gated transistor. The electron mobility shows a stepwise increase as a function of the electron occupation per quantum dot. When the occupation number is below two, transport occurs by tunneling between the S orbitals. Transport becomes 3 times faster when the occupation number is between two and eight; tunneling now occurs between the P orbitals. Electron transport is thus critically determined by the quantum properties of the building blocks.

  • Received 21 December 2001

DOI:https://doi.org/10.1103/PhysRevLett.89.036801

©2002 American Physical Society

Authors & Affiliations

A. L. Roest, J. J. Kelly, and D. Vanmaekelbergh*

  • Debye Institute, Utrecht University, P.O. Box 80000, 3508 TA Utrecht, The Netherlands

E. A. Meulenkamp

  • Philips Research Laboratories, WB 62, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands

  • *Electronic address: D.A.M.Vanmaekelbergh@phys.uu.nl

Comments & Replies

Vanmaekelbergh et al. Reply

D. Vanmaekelbergh, A. L. Roest, A. Germeau, J. J. Kelly, E. A. Meulenkamp, G. Allan, and C. Delerue
Phys. Rev. Lett. 91, 169704 (2003)

Comment on “Staircase in the Electron Mobility of a ZnO Quantum Dot Assembly due to Shell Filling” and “Optical Transitions in Artificial Few-Electron Atoms Strongly Confined inside ZnO Nanocrystals”

Moonsub Shim and P. Guyot-Sionnest
Phys. Rev. Lett. 91, 169703 (2003)

References (Subscription Required)

Click to Expand
Issue

Vol. 89, Iss. 3 — 15 July 2002

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×