A new technique of microscopic investigation is proposed by combining projection electron microscopy and off-axis holography. On the basis of the strong scattering of low energy electrons by light elements, this technique would be suitable for the observation of organic materials with a resolution better than 1 nm. A model has been developed to reconstruct the observed object from the holograms. Preliminary experimental results are obtained at medium resolution: 7 nm on networks of carbon fibers.

• Received 19 January 1996

DOI:https://doi.org/10.1103/PhysRevLett.76.3979