Observation of Impurity Cyclotron Resonance in Hg1xCdxTe

V. J. Goldman, H. D. Drew, M. Shayegan, and D. A. Nelson
Phys. Rev. Lett. 56, 968 – Published 3 March 1986
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Abstract

Impurity cyclotron resonance (ICR) has been observed in nHg1xCdxTe. This experiment provides conclusive evidence for donor-bound electrons in this semiconductor. The separation between the ICR and the free-carrier resonance is in satisfactory agreement with theoretical predictions for hydrogenic donors in a strong magnetic field. Saturation of the ICR absorption was used to determine the electron lifetimes of Å 106 sec in the lowest Landau level.

  • Received 4 November 1985

DOI:https://doi.org/10.1103/PhysRevLett.56.968

©1986 American Physical Society

Authors & Affiliations

V. J. Goldman* and H. D. Drew

  • Department of Physics and Astronomy, University of Maryland, College Park, Maryland 20742

M. Shayegan

  • Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544

D. A. Nelson

  • Honeywell Electro-Optics Division, Lexington, Massachusetts 02173

  • *Present address: Department of Electrical Engineering, Princeton University, Princeton, N.J. 08544.

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Issue

Vol. 56, Iss. 9 — 3 March 1986

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