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Submolecular Resolution Imaging of Molecules by Atomic Force Microscopy: The Influence of the Electrostatic Force

Joost van der Lit, Francesca Di Cicco, Prokop Hapala, Pavel Jelinek, and Ingmar Swart
Phys. Rev. Lett. 116, 096102 – Published 3 March 2016
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Abstract

The forces governing the contrast in submolecular resolution imaging of molecules with atomic force microscopy (AFM) have recently become a topic of intense debate. Here, we show that the electrostatic force is essential to understand the contrast in atomically resolved AFM images of polar molecules. Specifically, we image strongly polarized molecules with negatively and positively charged tips. A contrast inversion is observed above the polar groups. By taking into account the electrostatic forces between tip and molecule, the observed contrast differences can be reproduced using a molecular mechanics model. In addition, we analyze the height dependence of the various force components contributing to the high-resolution AFM contrast.

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  • Received 10 December 2015

DOI:https://doi.org/10.1103/PhysRevLett.116.096102

This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Joost van der Lit1, Francesca Di Cicco1, Prokop Hapala2, Pavel Jelinek2, and Ingmar Swart1,*

  • 1Debye Institute for Nanomaterials Science, Utrecht University, P.O. Box 80.000, 3508 TA Utrecht, The Netherlands
  • 2Institute of Physics, Academy of Sciences of the Czech Republic Cukrovarnicka 10, 1862 53 Prague, Czech Republic

  • *I.Swart@uu.nl

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Vol. 116, Iss. 9 — 4 March 2016

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