• Editors' Suggestion

Helical Edge Resistance Introduced by Charge Puddles

Jukka I. Väyrynen, Moshe Goldstein, and Leonid I. Glazman
Phys. Rev. Lett. 110, 216402 – Published 21 May 2013

Abstract

We study the influence of electron puddles created by doping of a 2D topological insulator on its helical edge conductance. A single puddle is modeled by a quantum dot tunnel coupled to the helical edge. It may lead to significant inelastic backscattering within the edge because of the long electron dwelling time in the dot. We find the resulting correction to the perfect edge conductance. Generalizing to multiple puddles, we assess the dependence of the helical edge resistance on the temperature and doping level and compare it with recent experimental data.

  • Received 7 March 2013

DOI:https://doi.org/10.1103/PhysRevLett.110.216402

© 2013 American Physical Society

Authors & Affiliations

Jukka I. Väyrynen, Moshe Goldstein, and Leonid I. Glazman

  • Department of Physics, Yale University, New Haven, Connecticut 06520, USA

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 110, Iss. 21 — 24 May 2013

Reuse & Permissions
Access Options
CHORUS

Article Available via CHORUS

Download Accepted Manuscript
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×