Nanoscale Optical Electrometer

A. N. Vamivakas, Y. Zhao, S. Fält, A. Badolato, J. M. Taylor, and M. Atatüre
Phys. Rev. Lett. 107, 166802 – Published 11 October 2011
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Abstract

We propose and demonstrate an all-optical approach to single-electron sensing using the optical transitions of a semiconductor quantum dot. The measured electric-field sensitivity of 5(V/m)/Hz corresponds to detecting a single electron located 5μm from the quantum dot—nearly 10 times greater than the diffraction limited spot size of the excitation laser—in 1 s. The quantum-dot-based electrometer is more sensitive than other devices operating at a temperature of 4.2 K or higher and further offers suppressed backaction on the measured system.

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  • Received 26 May 2011

DOI:https://doi.org/10.1103/PhysRevLett.107.166802

© 2011 American Physical Society

Authors & Affiliations

A. N. Vamivakas1, Y. Zhao1,2, S. Fält3, A. Badolato4, J. M. Taylor5,6, and M. Atatüre1

  • 1Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom
  • 2Physikalisches Institut, Ruprecht-Karls-Universität Heidelberg, Philosophenweg 12, 69120 Heidelberg, Germany
  • 3Sol Voltaics AB, Scheelevägen 17, Ideon Science Park, 223 70 Lund, Sweden
  • 4Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627, USA
  • 5Department of Physics, Massachusetts Institute of Technology, 77 Massachusetts Ave, Cambridge, Massachusetts 02139, USA
  • 6Joint Quantum Institute/National Institute of Standards of Technology, 100 Bureau Drive MS 8423, Gaithersburg, Maryland 20899, USA

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Issue

Vol. 107, Iss. 16 — 14 October 2011

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