Piezoresponse Force Microscopy Studies of Switching Behavior of Ferroelectric Capacitors on a 100-ns Time Scale

A. Gruverman, D. Wu, and J. F. Scott
Phys. Rev. Lett. 100, 097601 – Published 5 March 2008

Abstract

Piezoresponse force microscopy is a powerful technique for nm-scale studies but is usually limited by response time. In this Letter, we report the first direct studies of ferroelectric capacitor switching on a submicrosecond time scale. Simultaneous domain imaging and sub-μs transient current measurements establish a direct relationship between polarization P(t) and domain kinetics. Switching times scale with capacitor size over an order of magnitude. Small capacitors, where polarization reversal is dominated by domain wall motion, switch faster at high fields but more slowly at low fields while larger capacitors do the reverse.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 12 September 2007

DOI:https://doi.org/10.1103/PhysRevLett.100.097601

©2008 American Physical Society

Authors & Affiliations

A. Gruverman1,*, D. Wu2, and J. F. Scott3

  • 1Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, Nebraska, USA
  • 2Department of Physics, North Carolina State University, Raleigh, North Carolina, USA
  • 3Earth Sciences Department, Cambridge University, Cambridge CB2 3EQ, United Kingdom

  • *alexei_gruverman@unl.edu

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 100, Iss. 9 — 7 March 2008

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×