Discriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy

Stefan Kuhn and Philipp Rahe
Phys. Rev. B 89, 235417 – Published 13 June 2014

Abstract

Noncontact atomic force microscopy (NC-AFM) features the measurement of forces with highest spatial resolution and sensitivity, resolving forces of the order of pico-Newtons with submolecular resolution. However, the measured total force is a mixture composed of various interactions. While some interactions such as electrostatic or magnetic forces can be excluded by a careful design of the experiment, the subtraction of van der Waals forces, which mainly originate from London dispersion interactions between the macroscopic tip shank and the bulk sample, remains a challenge. We present the determination of the inherently present van der Waals forces in total interaction force data from fitting a suitable model, allowing for extraction of the short-range force component. We compare the applicability of several van der Waals models based on experimental interaction data from the calcite(101¯4) surface. The feasibility to fit these models to experimental data is critically discussed. We furthermore introduce criteria to assess the transition point from pure long-range interaction to mixed short- and long-range forces based on the variance of lateral and vertical force data. This determination allows us to extract the short-range interaction forces, which remained a challenge so far in NC-AFM experiments.

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  • Received 31 January 2014
  • Revised 23 April 2014

DOI:https://doi.org/10.1103/PhysRevB.89.235417

©2014 American Physical Society

Authors & Affiliations

Stefan Kuhn

  • Institut für Physikalische Chemie, Johannes Gutenberg-Universität Mainz, Duesbergweg 10-14, 55099 Mainz, Germany

Philipp Rahe*

  • Department of Physics and Astronomy, The University of Utah, 115 South 1400 East, Salt Lake City, Utah 84112-0830, USA

  • *rahe@physics.utah.edu

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Vol. 89, Iss. 23 — 15 June 2014

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