We have studied the electromagnetic parameters of $\mathrm{Y}{\mathrm{Ba}}_2{\mathrm{Cu}}_3{\mathrm{O}}_7$ Josephson junctions fabricated on bicrystalline substrates with different angles tilted around the [100] and [001] axis. Changing a technological parameter such as the junction width permits change to the resonant frequency of the barrier cavity. This change in the resonance frequency allows one to determine a frequency dependent dispersion relation of the dielectric constant $\epsilon \left(\omega \right)$. We have explored the proximity to a resonance in the dielectric response and analyzed its resonance frequency and damping constant. In terms of a $RLC$ circuital equivalence additional information on the inductive response is presented as a comparative study of junctions fabricated on substrates with different bicrystalline misorientations.

• Received 2 February 2006

DOI:https://doi.org/10.1103/PhysRevB.74.024507