Double-tip scanning tunneling microscope for surface analysis

Q. Niu, M. C. Chang, and C. K. Shih
Phys. Rev. B 51, 5502 – Published 15 February 1995
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Abstract

We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths.

  • Received 18 July 1994

DOI:https://doi.org/10.1103/PhysRevB.51.5502

©1995 American Physical Society

Authors & Affiliations

Q. Niu, M. C. Chang, and C. K. Shih

  • Department of Physics, University of Texas, Austin, Texas 78712

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Vol. 51, Iss. 8 — 15 February 1995

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