Dynamic scaling, zero-temperature fixed point, and the random-field Ising model

Y. S. Parmar and J. K. Bhattacharjee
Phys. Rev. B 49, 6350 – Published 1 March 1994
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Abstract

Experiments over a long range of frequencies reveal that the critical dynamics of random-field Ising models is dominated by activated hopping but the relevant exponent is quite different from the theoretical expectations based on the zero-temperature fixed point. We show that a careful application of dynamic scaling, and zero-temperature fixed point leads to an ever present ‘‘correction to scaling,’’ which causes the measured exponent to differ strongly from the expected value.

  • Received 19 August 1993

DOI:https://doi.org/10.1103/PhysRevB.49.6350

©1994 American Physical Society

Authors & Affiliations

Y. S. Parmar and J. K. Bhattacharjee

  • Department of Physics, Indian Institute of Technology, Kanpur 208016, India

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Vol. 49, Iss. 9 — 1 March 1994

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